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Chem Commun (Camb)
; 47(38): 10575-7, 2011 Oct 14.
Artigo
em Inglês
| MEDLINE
| ID: mdl-21869962
RESUMO
We measure the short-range chemical force between a silicon-terminated tip and individual adsorbed C(60) molecules using frequency modulation atomic force microscopy. The interaction with an adsorbed fullerene is sufficiently strong to drive significant atomic rearrangement of tip structures.
