The application of a vacuum-ultraviolet Fourier transform spectrometer and synchrotron-radiation source to measurements of bands of NO. VII. The final report.

Photoabsorption measurements of NO bands have been made by vacuum-ultraviolet Fourier transform spectrometry with a resolution of 0.12 cm(-1) in the wavelength region of 166.2-196.2 nm. Accurate line positions are obtained for the delta(upsilon,0) bands with upsilon=2, 3, the epsilon(upsilon,0) bands with upsilon=2, 3, and the beta(upsilon,0) bands with upsilon=10,12,14. Absolute term values are found for the corresponding upper levels C(2,3), D(2,3), and B(10,12,14). Accurate rotational line integrated cross sections have also been obtained for the lines in these bands. Integrated cross sections reported in our earlier papers [J. Chem. Phys. 109, 1751 (1998); 112, 2251 (2000); 115, 3719 (2001); 116, 155 (2002); 117, 10621 (2002); 119, 8373 (2003)] have been revised, and the results reported here comprise the delta(upsilon,0) bands with upsilon=0-3, the epsilon(upsilon,0) bands with upsilon=0-3, the beta(upsilon,0) bands with upsilon=6,7,9-12,14, and the gamma(3,0) band. For each band, the band oscillator strength is obtained from the sum of the line strengths of all rotational lines, and these are compared with other published values.

High resolution FTS studies of glow discharge spectra line profiles and line widths.

High resolution studies using Fourier transform spectrometry of the spectra emitted in the visible and ultraviolet regions by a microwave boosted glow discharge source have shown that when the source is operated in the dc (unboosted) mode, two anomalous forms of line profile occur for some analyte elements. (1) Some Fe I lines appear to have a triangular base of half-width about five times greater than that of the line proper. (2) Some Fe II and Ti II lines exhibit satellites about 8 cm(-1) wide and an intensity of up to 2% of the peak value on either side of the main line. Both effects depend on the carrier gas and its pressure and are much less pronounced or even absent in the boosted mode. They could both affect the accuracy of analytical results, particularly for depth-profiling. Further studies are in progress.

Ghosts and artifacts in Fourier-transform spectrometry.

Ghosts in Fourier-transform spectrometry are important for three reasons: they can give rise to spurious coincidences of frequency differences in spectral analysis, distort the phase correction, and set a limit to the attainable signal-to-noise ratio. The various types of ghost, originating from amplitude modulation, phase modulation, and intermodulation, are described and discussed, together with some hardware and software artifacts. Recipes are given for identifying these features and, where possible, avoiding harmful effects from them.