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1.
Langmuir ; 35(9): 3354-3362, 2019 03 05.
Artigo em Inglês | MEDLINE | ID: mdl-30741553

RESUMO

Protein immobilization in a specific conformation or orientation at an interface is influenced by specific interactions with the outer layer of the surface. A strategy to build-up a complex construct which is able to orient protein molecules, based on metal-cation chelation processes, is reported. The proposed methodology implies the formation of a mercaptoundecanoic acid monolayer on a gold surface that is activated to attach covalently the tripeptide glycyl-l-histidyl-l-lysine (GHK) on the surface, whose sites are then employed to chelate copper ions, providing a selective platform for the orientation of human serum albumin (HSA) molecules. The protein adsorption process on GHK and GHK-Cu(II)-complex surfaces was monitored by the in situ quartz crystal microbalance with dissipation monitoring (QCM-D) and force spectroscopy technique. The changes in frequency and dissipation factor as well as the D- f plots from QCM-D measurements help to characterize the changes in the protein conformation and are confirmed by force curve spectroscopy results. An improved kinetic model, based on random sequential adsorption with variable protein footprints, has been developed to predict and simulate the experimentally found HSA average surface coverage onto the GHK and GHK-Cu(II)-complex surfaces.


Assuntos
Quelantes/química , Oligopeptídeos/química , Albumina Sérica Humana/química , Adsorção , Anticorpos Monoclonais/química , Anticorpos Monoclonais/imunologia , Cobre/química , Humanos , Proteínas Imobilizadas/química , Cinética , Método de Monte Carlo , Conformação Proteica , Técnicas de Microbalança de Cristal de Quartzo , Albumina Sérica Humana/imunologia
2.
Rapid Commun Mass Spectrom ; 29(23): 2204-10, 2015 Dec 15.
Artigo em Inglês | MEDLINE | ID: mdl-26522311

RESUMO

RATIONALE: Secondary ion mass spectrometry (SIMS) with polyatomic primary ions provides a successful tool for molecular depth profiling of polymer systems, relevant in many technological applications. Widespread C60 sources, however, cause in some polymers extensive damage with loss of molecular information along depth. We study a method, based on the use of a radical scavenger, for inhibiting ion-beam-induced reactions causing sample damage. METHODS: Layered polystyrene sulfonate and polyacrylic acid based polyelectrolyte films, behaving differently towards C60 beam-induced damage, were selected and prepared as model systems. They were depth profiled by means of time-of-flight (TOF)-SIMS in dual beam mode, using fullerene ions for sputtering. Nitric oxide was introduced into the analysis chamber as a radical scavenger. The effect of sample cooling combined with NO-dosing on the quality of depth profiles was explored. RESULTS: NO-dosing during C60-SIMS depth profiling of >1 micrometer-thick multilayered polyelectrolytes allows detection, along depth, of characteristic fragments from systems otherwise damaged by C60 bombardment, and increases sputtering yield by more than one order of magnitude. By contrast, NO has little influence on those layers that are well profiled with C60 alone. Such leveling effect, more pronounced at low temperature, leads to a dramatic improvement of profile quality, with a clear definition of interfaces. CONCLUSIONS: NO-dosing provides a tool for extending the applicability, in SIMS depth profiling, of the widely spread fullerene ion sources. In view of the acceptable erosion rates on inorganics, obtainable with C60, the method could be of relevance also in connection with the 3D-imaging of hybrid polymer/inorganic systems.


Assuntos
Resinas Acrílicas/análise , Fulerenos/química , Óxido Nítrico/química , Poliestirenos/análise , Espectrometria de Massa de Íon Secundário/métodos , Eletrólitos/análise , Íons/química
3.
Anal Chem ; 85(10): 5064-70, 2013 May 21.
Artigo em Inglês | MEDLINE | ID: mdl-23590425

RESUMO

Organic depth profiling using secondary ion mass spectrometry (SIMS) provides valuable information about the three-dimensional distribution of organic molecules. However, for a range of materials, commonly used cluster ion beams such as C60(n+) do not yield useful depth profiles. A promising solution to this problem is offered by the use of nitric oxide (NO) gas dosing during sputtering to reduce molecular cross-linking. In this study a C60(2+) ion beam is used to depth profile a polystyrene film. By systematically varying NO pressure and sample temperature, we evaluate their combined effect on organic depth profiling. Profiles are also acquired from a multilayered polystyrene and polyvinylpyrrolidone film and from a polystyrene/polymethylmethacrylate bilayer, in the former case by using an optimized set of conditions for C60(2+) and, for comparison, an Ar2000(+) ion beam. Our results show a dramatic improvement for depth profiling with C60(2+) using NO at pressures above 10(-6) mbar and sample temperatures below -75 °C. For the multilayered polymer film, the depth profile acquired using C60(2+) exhibits high signal stability with the exception of an initial signal loss transient and thus allows for successful chemical identification of each of the six layers. The results demonstrate that NO dosing can significantly improve SIMS depth profiling analysis for certain organic materials that are difficult to analyze with C60(n+) sputtering using conventional approaches/conditions. While the analytical capability is not as good as large gas cluster ion beams, NO dosing comprises a useful low-cost alternative for instruments equipped with C60(n+) sputtering.


Assuntos
Argônio/química , Fulerenos/química , Espectrometria de Massas/métodos , Óxido Nítrico/química , Poliestirenos/química , Povidona/química , Modelos Moleculares , Conformação Molecular
4.
Anal Bioanal Chem ; 396(8): 2863-9, 2010 Apr.
Artigo em Inglês | MEDLINE | ID: mdl-20143225

RESUMO

The aim of this work is to optimise and evaluate radiofrequency glow discharge (RF GD) time-of-flight mass spectrometry (TOFMS) for identification of organic polymers. For this purpose, different polymers including poly[methylmethacrylate], poly[styrene], polyethylene terephthalate-co-isophthalate and poly[alpha-methylstyrene] have been deposited on silicon wafers and the RF GD-TOFMS capabilities for qualitative identification of these polymeric layers by molecular depth profiling have been investigated. Although some molecular information using the RF continuous mode is available, the pulsed mode offers a greater analytical potential to characterise such organic coatings. Some formed polyatomic ions have proved to be useful to identify the different polymer layers, confirming that layers having similar elemental composition but different polymer structure could be also differentiated and identified.

5.
Phys Chem Chem Phys ; 11(20): 4033-8, 2009 May 28.
Artigo em Inglês | MEDLINE | ID: mdl-19440633

RESUMO

A terpyridine-functionalized perylene bisimide chromophore (TPBI) has been used as a building block in the stepwise, layer-by-layer fabrication of self-assembled Fe-TPBI multilayers on gold, with the assembled supramolecular chains oriented approximately perpendicular to the gold surface. Time-resolved spectroscopy measurements seem to indicate that the energy absorbed by the multilayer is promptly dissipated to the gold surface by ultrafast processes.

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