Emission characteristics of naphthalene from ship exhausts under global sulfur cap.

The global sulfur limit regulation mandates the use of 0.5 % low sulfur fuel oil (LSFO) to reduce emissions of sulfur oxides (SOx), nitrogen oxides (NOx), and particulate matter (PM). However, the addition of naphthalene (Nap) to LSFO to stabilize its quality has led to an increase in polycyclic aromatic hydrocarbons (PAHs), with Nap being the main pollutant. This study investigates the effects of Nap in ship exhaust by analyzing the emission concentrations of volatile organic compounds (VOCs) and Nap in the exhaust of 16 ships, including 2 container ships, 6 bulk carriers, 1 tanker, 2 ferries, 3 fishing vessels, and 2 harbor crafts, based on USEPA method TO-15A. The results show that the percentage of Nap emissions in the exhaust gases of the 16 ship engines ranged from 77 % to 97 % of the total volatile organic compound (TVOC). The Nap concentration in the exhaust of fishing vessels, tanker, and harbor craft exceeded the occupational exposure limit of 50,000 µg/m3, with fishing vessels having the highest TVOC and Nap concentrations. The enhanced Nap emission in the air degrades air quality in port cities and poses an obvious potential public health risk. While the benefits of the global sulfur cap are being secured, additional efforts should be made to reduce the undetected side effects. Alternative stabilizers of LSFO should be considered, or Nap emission control should be boosted to mitigate the potential negative impact on harbor air quality.

Non-Contact Optical Detection of Foreign Materials Adhered to Color Filter and Thin-Film Transistor.

This paper describes the non-contact optical detection of debris material that adheres to the substrates of color filters (CFs) and thin-film transistors (TFTs) by area charge-coupled devices (CCDs) and laser sensors. One of the optical detections is a side-view illumination by an area CCD that emits a coherency light to detect debris on the CF. In contrast to the height of the debris material, the image is acquired by transforming the geometric shape from a square to a circle. As a result, the side-view illumination from the area CCD identified the height of the debris adhered to the black matrix (BM) as well as the red, green, and blue of a CF with 95, 97, 98, and 99% accuracy compared to the golden sample. The uncertainty analysis was at 5% for the BM, 3% for the red, 2% for the green, and 1% for the blue. The other optical detection, a laser optical interception with a horizontal alignment, inspected the material foreign to the TFT. At the same time, laser sensors intercepted the debris on the TFT at a voltage of 3.5 V, which the five sets of laser optics make scanning the sample. Consequently, the scanning rate reached over 98% accuracy, and the uncertainty analysis was within 5%. Thus, both non-contact optical methods can detect debris at a 50 µm height or lower. The experiment presents a successful design for the efficient prevention of a valuable component malfunction.

Detection of Electrical Circuit in a Thin-Film-Transistor Liquid-Crystal Display Using a Hybrid Optoelectronic Apparatus: An Array Tester and Automatic Optical Inspection.

In this study, we developed a high-resolution, more accurate, non-destructive apparatus for refining the detection of electrode pixels in a thin-film-transistor liquid-crystal display (TFT-LCD). The hybrid optoelectronic apparatus simultaneously uses an array tester linked with the automatic optical inspection of panel defects. Unfortunately, due to a tiny air gap in the electro-optical inspector, the situation repeatedly causes numerous scratches and damages to the modulator; therefore, developing alternative equipment is necessary. Typically, in TFT-LCDs, there are open, short, and cross short electrical defects. The experiment utilized a multiple-line scan with the time delay integration (TDI) of a charge-coupled device (CCD) to capture a sharp image, even under low light, various speeds, or extreme conditions. In addition, we explored the experimental efficacy of detecting the electrode pixel of the samples and evaluated the effectiveness of a 7-inch opaque quartz mask. The results show that an array tester and AOI can detect a TFT-LCD electrode pixel sufficiently; therefore, we recommend adopting the hybrid apparatus in the TFT-LCD industry.

Light Emitted Diode on Detecting Thin-Film Transistor through Line-Scan Photosensor.

This paper explores the effectiveness of the white, red, green, and blue light emitted diodes (LEDs) light sources to detect the third layer of the electrode pixel and the fourth layer of the via-hole passivation on thin-film transistors. The time-delay-integration charge-coupled device and a reflective spectrometer were implemented in this experiment. The optical conditions are the same, as each light source and the digital image's binary method also recognize the sharpness and contrast in the task. Consequently, the white and the blue LED light sources can be candidates for the light source for the optical inspection, especially for monochromic blue LED's outperformance among the light sources. The blue LED demonstrates the high spatial resolution and short wavelength's greater energy to trigger the photosensor. Additionally, the metal material has shown a tremendous responsibility in the photosensor with 150 Dn/nj/cm2 over the sensibility. The mercury 198Hg-pencil discharge lamp emits the stable spectral wavelength to significantly calibrate the spectrometer's measurement.

Effectiveness of Electrical and Optical Detection at Pixel Circuit on Thin-Film Transistors.

The paper presents a typology of electrical open and short defects on thin-film transistors (TFT) using an electrical tester and automatic optical inspection (AOI). The experiment takes the glass 8.5th generation to detect the electrical characteristics engaged with time delay and integration (TDI) charged-coupled-devices (CCDs), a fast line-scan, and a review CCD with five sets of magnification lenses for further inspection. An automatic data acquisition program (ADAP) controls the open/short (O/S) sensor, TDI-CCD, and motor device for machine vision and statistics of substrate defects simultaneously. Furthermore, the quartz mask installed on AOI verified its optical resolution; a TDI-CCD can grab an image of a moving object during transfers of the charge in synchronous scanning with the object that is significant.

Optical density measurement of thin-film transistor liquid crystal display by a monochrome light-emitting diode.

A new method using a monochromatic light-emitting diode (LED) to measure the optical density (OD) of the black matrix of thin-film transistor liquid crystal display (LCD) is developed in this study. The measured results show that the average OD difference is within 1% between the proposed 3 W monochromatic LED and the currently adopted 100 W quartz halogen lamp. On the other hand, the monochromatic LED reduces the boosting time by 40% in establishing the baseline database. The 3sigma standard deviation of the OD of the test samples is from 0.1% to 0.6% for the LED, whereas it is from 0.5% to 1.2% for the halogen lamp. Using standard glass samples, the monochromatic LED demonstrates accuracy within 1.58%, better than that of the quartz halogen lamp. Therefore, it can substitute for the quartz halogen lamp currently used in the thin-film transistor LCD industry for OD measurement of the black matrix layer, as it is faster, is more accurate, is more reliable, and consumes less power.