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J Nanosci Nanotechnol ; 6(11): 3422-5, 2006 Nov.
Artigo em Inglês | MEDLINE | ID: mdl-17252780

RESUMO

The electronic structure of laser-deposited P-doped ZnO films was investigated by X-ray absorption near-edge structure spectroscopy (XANES) at the O K-, Zn K-, and Zn L3-edges. While the O K-edge XANES spectrum of the n-type P-doped ZnO demonstrates that the density of unoccupied states, primarily O 2p-P 3sp hybridized states, is significantly high, the O K-edge XANES spectrum of the p-type P-doped ZnO shows a sharp decrease in intensity of the corresponding feature indicating that P replaces O sites in the ZnO lattice, and thereby generating P(O). This produces holes to maintain charge neutrality that are responsible for the p-type behavior of P-doped ZnO. Both the Zn K-, and Zn L3-edge XANES spectra of the P-doped ZnO reveal that Zn plays no significant role in the p-type behavior of ZnO:P.


Assuntos
Nanotecnologia/métodos , Óxido de Zinco/química , Calibragem , Condutividade Elétrica , Eletrônica , Elétrons , Lasers , Oxigênio/química , Fósforo , Fótons , Espectrofotometria , Temperatura , Raios X , Zinco/química , Compostos de Zinco/química
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