Bi-sigmoid spike-timing dependent plasticity learning rule for magnetic tunnel junction-based SNN.

In this study, we explore spintronic synapses composed of several Magnetic Tunnel Junctions (MTJs), leveraging their attractive characteristics such as endurance, nonvolatility, stochasticity, and energy efficiency for hardware implementation of unsupervised neuromorphic systems. Spiking Neural Networks (SNNs) running on dedicated hardware are suitable for edge computing and IoT devices where continuous online learning and energy efficiency are important characteristics. We focus in this work on synaptic plasticity by conducting comprehensive electrical simulations to optimize the MTJ-based synapse design and find the accurate neuronal pulses that are responsible for the Spike Timing Dependent Plasticity (STDP) behavior. Most proposals in the literature are based on hardware-independent algorithms that require the network to store the spiking history to be able to update the weights accordingly. In this work, we developed a new learning rule, the Bi-Sigmoid STDP (B2STDP), which originates from the physical properties of MTJs. This rule enables immediate synaptic plasticity based on neuronal activity, leveraging in-memory computing. Finally, the integration of this learning approach within an SNN framework leads to a 91.71% accuracy in unsupervised image classification, demonstrating the potential of MTJ-based synapses for effective online learning in hardware-implemented SNNs.

SRAM-Based PUF Readouts.

Large-scale parameter characterization of Physical Unclonable Functions (PUFs) is of paramount importance in order to assess the quality and thus the suitability of such PUFs which would then be developed as an industrial-grade solution for hardware root of trust. Carrying out a proper characterization requires a large number of devices that need to be repeatedly sampled at various conditions. These prerequisites make PUF characterization process a very time-consuming and expensive task. Our work presents a dataset for the study of SRAM-based PUFs on microcontrollers; it includes full SRAM readouts along with internal voltage and temperature sensors of 84 microcontrollers of STM32 type. Data has been gathered with a custom-made and open platform designed for the automatic acquisition of SRAM readouts of such devices. This platform also provides possibilities of experimenting aging and reliability properties.