Electron fluctuation induced resonance broadening in nano electromechanical systems: the origin of shear force in vacuum.

This article presents a study of the poorly understood "shear-force" used in an important class of near-field instruments that use mechanical resonance feedback detection. In the case of a metallic probe near a metallic surface in vacuum, we show that in the 10-60 nm range there is no such a thing as a shear-force in the sense of the nonconservative friction force. Fluctuations of the oscillator resonance frequency, likely induced by local charge variations, could account for the reported effects in the literature without introducing a dissipative force.