RESUMO
A window type of the environmental cell system for a high-voltage electron microscope was developed and applied to in situ observation of a palladium (Pd) thin film. For in situ hydrogenation of Pd thin films, the distances of the lattice fringes were 0.20 and 0.23 nm, which correspond to the lattice d spacings of ß-phase (200) and (111) planes. Expansion of the Pd lattice happened as a result of phase transformation from the α phase to the ß phase. In particular, the lattice fringes were clearly distinguished, and the dislocation behavior during Pd hydrogenation was easily recognized according to the corresponding inverse fast fourier transform images. Furthermore, significant growth in the number of dislocations was observed at the grain boundary during increasing hydrogen pressure in the cell.
RESUMO
Transmission electron microscope (TEM) observation of light metal hydrides is complicated by the instability of these materials under electron irradiation. In this study, the electron kinetic energy dependences of the interactions of incident electrons with lithium, sodium and magnesium hydrides, as well as the constituting element effect on the interactions, were theoretically discussed, and electron irradiation damage to these hydrides was examined using in situ TEM. The results indicate that high incident electron kinetic energy helps alleviate the irradiation damage resulting from inelastic or elastic scattering of the incident electrons in the TEM. Therefore, observations and characterizations of these materials would benefit from increased, instead decreased, TEM operating voltage.
