Soft X-ray Exposure Promotes Na Intercalation in Graphene Grown on Si-Face SiC.

An investigation of how electron/photon beam exposures affect the intercalation rate of Na deposited on graphene prepared on Si-face SiC is presented. Focused radiation from a storage ring is used for soft X-ray exposures while the electron beam in a low energy electron microscope is utilized for electron exposures. The microscopy and core level spectroscopy data presented clearly show that the effect of soft X-ray exposure is significantly greater than of electron exposure, i.e., it produces a greater increase in the intercalation rate of Na. Heat transfer from the photoelectrons generated during soft X-ray exposure and by the electrons penetrating the sample during electron beam exposure is suggested to increase the local surface temperature and thus the intercalation rate. The estimated electron flux density is 50 times greater for soft X-ray exposure compared to electron exposure, which explains the larger increase in the intercalation rate from soft X-ray exposure. Effects occurring with time only at room temperature are found to be fairly slow, but detectable. The graphene quality, i.e., domain/grain size and homogeneity, was also observed to be an important factor since exposure-induced effects occurred more rapidly on a graphene sample prepared in situ compared to on a furnace grown sample.

A spectroscopic study of self-assembled monolayer of porphyrin-functionalized oligo(phenyleneethynylene)s on gold: the influence of the anchor moiety.

Porphyrin-functionalized oligo(phenyleneethynylene)s (OPE) are promising molecules for molecular electronics applications. Three such molecules (1-3) with the common structure P-OPE-AG (P and AG are a porphyrin and anchor group, respectively) and different anchor groups, viz. an acetyl protected thiol, -S-COCH3 (1), an acetyl protected thiol with methylene linker, -CH2-S-COCH3 (2), and a trimethylsilylethynyl group, -C(triple bond)C-Si(CH3)3 (3) have been synthesized and the corresponding self-assembled monolayers (SAMs) on Au(111) substrates have been prepared. The integrity and structural properties of these films were studied by X-ray photoelectron spectroscopy and near-edge X-ray absorption fine structure spectroscopy. The results suggest that the films formed from 1 have a high orientational order with an almost upright orientation and dense packing of the molecular constituents, i.e. represent a high quality SAM. In contrast, molecule 2 formed disordered molecular layers on Au, even though the molecule-surface bonding (thiolate) is the same as in the case of molecule 1. This suggests that the methylene linker in molecule 2 has a strong impact on the quality of the resulting film, so that a well-ordered SAM cannot be formed. The silane system, 3, is also able to bind to the gold surface but the resulting SAM has a poor quality, being significantly disordered and/or comprised of strongly inclined molecules. The above results suggest that the nature of the anchor group along with a possible linker is an important parameter which, to a high extent, predetermines the entire quality of OPE-based molecular layers.

Characterization of self-assembled monolayers of oligo(phenyleneethynylene) derivatives of varying shapes on gold: effect of laterally extended pi-systems.

Fully conjugated organic molecules, such as the oligo(phenyleneethynylene) (OPE) systems, are of growing interest within the field of molecular electronics, as is the self-assembly of well-defined molecular thin films with predefined functions. The structure and function of such films are intimately related and governed by the structures of their molecular constituents, through the intermolecular interactions and the interactions between the molecules and the substrate, onto which the film is assembled. Here we report on the synthesis of a series of three OPE derivatives, with the general structure phenylethynylene-aryl-ethynylenephenylene-headgroup, and the structural investigation of the self-assembled monolayers (SAMs) formed from them on Au(111) surfaces. The SAMs were characterized by infrared reflection-absorption spectroscopy, spectroscopic ellipsometry, high-resolution X-ray photoemission spectroscopy, and near-edge X-ray absorption fine structure spectroscopy. The effective thickness of the SAMs was observed to decrease as the pi-system of the aryl moiety of the OPE adsorbate was extended perpendicular to its molecular long axis. Changing the aryl moiety from benzene to naphthalene to anthracene resulted in lower molecular surface densities and larger molecular inclination. The average tilt angles for the benzene, naphthalene, and anthracene SAMs were found to be about 30 degrees , 40 degrees , and 42 degrees from the surface normal, respectively. For the largest adsorbate, the anthracene derivative, there is spectroscopic evidence suggesting the existence of nonequivalent binding sites. The differences observed between the SAMs are rationalized in terms of the shape of the adsorbates and the strength of the pi-pi interactions between them.