Random forest microplastic classification using spectral subsamples of FT-IR hyperspectral images.

In this work, a random decision forest model is built for fast identification of Fourier-transform infrared spectra of the eleven most common types of microplastics in the environment. The random decision forest input data is reduced to a combination of highly discriminative single wavenumbers selected using a machine learning classifier. This dimension reduction allows input from systems with individual wavenumber measurements, and decreases prediction time. The training and testing spectra are extracted from Fourier-transform infrared hyperspectral images of pure-type microplastic samples, automatizing the process with reference spectra and a fast background correction and identification algorithm. Random decision forest classification results are validated using procedurally generated ground truth. The classification accuracy achieved on said ground truths are not expected to carry over to environmental samples as those usually contain a broader variety of materials.

Nanoscale Spatial Resolution in Far-Field Raman Imaging Using Hyperspectral Unmixing in Combination with Positivity Constrained Super-Resolution.

This work introduces hyper-resolution (HyRes), a numerical approach for spatial resolution enhancement that combines hyperspectral unmixing and super-resolution image restoration (SRIR). HyRes yields a substantial increase in spatial resolution of Raman spectroscopy while simultaneously preserving the undistorted spectral information. The resolving power of this technique is demonstrated on Raman spectroscopic data from a polymer nanowire sample. Here, we demonstrate an achieved resolution of better than 14 nm, a more than eightfold improvement on single-channel image-based SRIR and 25× better than regular far-field Raman spectroscopy, and comparable to near-field probing techniques.

Sub-Micron Spatial Resolution in Far-Field Raman Imaging Using Positivity-Constrained Super-Resolution.

Raman microscopy is a valuable tool for detecting physical and chemical properties of a sample material. When probing nanomaterials or nanocomposites the spatial resolution of Raman microscopy is not always adequate as it is limited by the optical diffraction limit. Numerical post-processing with super-resolution algorithms provides a means to enhance resolution and can be straightforwardly applied. The aim of this work is to present interior point least squares (IPLS) as a powerful tool for super-resolution in Raman imaging through constrained optimization. IPLS's potential for super-resolution is illustrated on numerically generated test images. Its resolving power is demonstrated on Raman spectroscopic data of a polymer nanowire sample. Comparison to atomic force microscopy data of the same sample substantiates that the presented method is a promising technique for analyzing nanomaterial samples.