High-accuracy computation of hard X-ray focusing and imaging for refractive optics.

A mathematical apparatus for solving problems of X-ray wave propagation through complex optical systems, when the lens thickness can change with jumps, is developed and presented. The developed method is based on the use of the superposition of oriented Gaussian beams, which satisfy the Helmholtz equation with high accuracy. The wave propagation in air and through kinoform and ordinary lenses is considered. Focusing and imaging properties are compared for both types of X-ray optics. The diffraction effects arising due to thickness jumps in the kinoform lenses and the influence of these jumps on the X-ray focusing and imaging are investigated. The prospect of using the developed theory for X-ray optics applications is discussed.

Oriented Gaussian beams for high-accuracy computation with accuracy control of X-ray propagation through a multi-lens system.

A highly accurate method for calculating X-ray propagation is developed. Within this approach, the propagating wave is represented as a superposition of oriented Gaussian beams. The direction of wave propagation in each Gaussian beam agrees with the local direction of propagation of the X-ray wavefront. When calculating the propagation of X-ray waves through lenses, the thin lens approximation is applied. In this approximation, the wave parameters change discontinuously when the wave passes through a lens; the corresponding explicit formulae are derived. The theory is applied to highly accurate calculation of the focusing of X-rays by a system of many beryllium lenses. Fine structure of the wave electric field on the focal plane is revealed and studied. The fine structure is formed due to the diffraction of waves at the edges of the lens apertures. Tools for controlling the calculation accuracy are proposed. The amplitude of the electric field on the focal plane and the focal spot width are shown to be very sensitive to the quality of the calculation, while the best focus position can be obtained even from simple calculations.

A high-accuracy complex-phase method of simulating X-ray propagation through a multi-lens system.

The propagation of X-ray waves through an optical system consisting of many X-ray refractive lenses is considered. For solving the problem for an electromagnetic wave, a finite-difference method is applied. The error of simulation is analytically estimated and investigated. It was found that a very detailed difference grid is required for reliable and accurate calculations of the propagation of X-ray waves through a multi-lens system. The reasons for using a very detailed difference grid are investigated. It was shown that the wave phase becomes a function, very quickly increasing with increasing distance from the optical axis, after the wave has passed through the multi-lens system. If the phase is a quickly increasing function of the coordinates perpendicular to the optical axis, then the electric field of the wave is a quickly oscillating function of these coordinates, and thus a very detailed difference grid becomes necessary to describe such a wavefield. To avoid this difficulty, an equation for the phase function is proposed as an alternative to the equation of the electric field. This allows reliable and accurate simulations to be carried out when using the multi-lens system. An equation for the phase function is derived and used for accurate simulations. The numerical error of the suggested method is estimated. It is shown that the equation for the phase function allows efficient simulations to be fulfilled for the multi-lens system.