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Water Sci Technol ; 55(12): 153-60, 2007.
Artigo em Inglês | MEDLINE | ID: mdl-17674842

RESUMO

Doped and undoped titanium dioxide films have been deposited on indium tin oxide glass using the sol-gel technique. The percentage of rutile in the prepared TiO2, calcined at 823 K and determined by X-ray diffraction, was 23% compared to 24% of rutile in P25-TiO2. Cerium doped TiO2 showed mainly the anatase phase, as characterised by both X-ray diffraction and Raman spectroscopy. The electrochemical and photoelectrochemical properties of the films were studied by cyclic voltammetry and electrochemical impedance spectroscopy. The (photo)electrochemical characteristics of the different films are reported and discussed.


Assuntos
Transição de Fase , Titânio/química , Eletroquímica , Eletrodos , Géis/química , Fotoquímica , Difração de Raios X
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