Pressure-Driven Changes in the Electronic Bonding Environment of GeO2 Glass above Megabar Pressures.

Noncrystalline oxides under pressure undergo gradual structural modifications, highlighted by the formation of a dense noncrystalline network topology. The nature of the densified networks and their electronic structures at high pressures may account for the mechanical hardening and the anomalous changes in electromagnetic properties. Despite its importance, direct probing of the electronic structures in amorphous oxides under compression above the Mbar pressure (>100 GPa) is currently lacking. Here, we report the observation of pressure-driven changes in electronic configurations and their delocalization around oxygen in glasses using inelastic X-ray scattering spectroscopy (IXS). In particular, the first O K-edge IXS spectra for compressed GeO2 glass up to 148 GPa, the highest pressure ever reached in an experimental study of GeO2 glass, reveal that the glass densification results from a progressive increase of oxygen proximity. While the triply coordinated oxygen [3]O is dominant below ∼50 GPa, the IXS spectra resolve multiple edge features that are unique to topologically disordered [4]O upon densification above 55 GPa. Topological compaction in GeO2 glass above 100 GPa results in pronounced electronic delocalization, revealing the contribution from Ge d-orbitals to oxide densification. Strong correlations between the glass density and the electronic configurations beyond the Mbar conditions highlight the electronic origins of densification of heavy-metal-bearing oxide glasses. Current experimental breakthroughs shed light on the direct probing of the electronic density of states in high-Z oxides above 1 Mbar, offering prospects for studies on the pressure-driven changes in magnetism, superconductivity, and electronic transport properties in heavy-metal-bearing oxides under compression.

Oxygen Quadclusters in SiO_{2} Glass above Megabar Pressures up to 160 GPa Revealed by X-Ray Raman Scattering.

As oxygen may occupy a major volume of oxides, a densification of amorphous oxides under extreme compression is dominated by reorganization of oxygen during compression. X-ray Raman scattering (XRS) spectra for SiO_{2} glass up to 1.6 Mbar reveal the evolution of heavily contracted oxygen environments characterized by a decrease in average O-O distance and the potential emergence of quadruply coordinated oxygen (oxygen quadcluster). Our results also reveal that the edge energies at the centers of gravity of the XRS features increase linearly with bulk density, yielding the first predictive relationship between the density and partial density of state of oxides above megabar pressures. The extreme densification paths with densified oxygen in amorphous oxides shed light upon the possible existence of stable melts in the planetary interiors.

Structure of amorphous aluminum oxide.

Whereas prototypical Al(2)O(3) is not a glass former, amorphous Al(2)O(3) can be formed as thin films through vapor deposition and can serve as a structural model for the Al(2)O(3) glass. The first two-dimensional solid-state NMR experiments for amorphous Al(2)O(3) thin film reveal that four- and five-coordinated species are predominant (95%), while six-coordinated species are minor. Such a species distribution is remarkably similar to what has been predicted theoretically for Al(2)O(3) melts. Upon annealing to 800 degrees C the five-coordinated species becomes negligible, indicating the onset of crystallization of Al(2)O(3).