An innovative and viable route for the realization of ultra-thin supercapacitors electrodes assembled with carbon nanotubes.

Electrochemical Double Layer Capacitors (EDLC), also known as supercapacitors, have been fabricated using Single Walled Carbon Nanotubes (SWCNTs) as active material for electrode assembling. In particular a new way of fabrication of ultra-thin electrodes (< or = 25 microm) directly formed on the separator has been proposed, and a prototype of EDLC has been realized and tested. For such devices the specific capacitance is in the range 40-45 F/g and the internal resistances in the range 6-8 omega x cm2, at current density of 2 mA x cm-2.

Evolution of radiation induced defects and the type inversion in high resistivity silicon under neutron irradiation.

A model which describes the type conductivity inversion and the Fermi level stabilisation in high purity n-silicon under last neutron irradiation has been considered. This model takes into account shallow impurities, oxygen, A- and E-centres and deep amphoteric centres (the vacancy complexes). The role of divacancies is dominant in the Fermi level stabilisation effect. The neutron fluence when the type inversion is observed has been calculated for various initial n-silicon. The results obtained describe peculiarities of the behaviour of neutron integral dosemeters. Characteristics of p-i-n diodes used as fast neutron sensors over a wide dose range and the influence of both the carrier life time and the silicon resistivity changes on the sensor sensitivity are discussed. Using long base diodes fabricated from high resistivity silicon (>10 kohm x cm) allows the sensitivity to reach 5 V x Gy(-1) (tissue).