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Mechanical property measurements of nanoscale structures using an atomic force microscope.
Sundararajan, Sriram; Bhushan, Bharat; Namazu, Takahiro; Isono, Yoshitada.
Affiliation
  • Sundararajan S; Department of Mechanical Engineering, The Ohio State University, Columbus 43210-1107, USA.
Ultramicroscopy ; 91(1-4): 111-8, 2002 May.
Article in En | MEDLINE | ID: mdl-12211458
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Collection: 01-internacional Database: MEDLINE Language: En Journal: Ultramicroscopy Year: 2002 Document type: Article Affiliation country: United States Country of publication: Netherlands
Search on Google
Add to My VHL
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XML
PubMed Links

Collection: 01-internacional Database: MEDLINE Language: En Journal: Ultramicroscopy Year: 2002 Document type: Article Affiliation country: United States Country of publication: Netherlands