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Local structure study of dilute Er in III-V semiconductors by fluorescence EXAFS.
Ofuchi, H; Kawamura, D; Tsuchiya, J; Matsubara, N; Tabuchi, M; Fujiwara, Y; Takeda, Y.
Affiliation
  • Ofuchi H; Department of Materials Science and Engineering, Graduate School of Engineering, Nagoya University, Furo-Cho, Chikusa-Ku, Nagoya 464-8603, Japan.
J Synchrotron Radiat ; 5(Pt 3): 1061-3, 1998 May 01.
Article in En | MEDLINE | ID: mdl-15263745
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Collection: 01-internacional Database: MEDLINE Language: En Journal: J Synchrotron Radiat Journal subject: RADIOLOGIA Year: 1998 Document type: Article Affiliation country: Japan Country of publication: United States
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Collection: 01-internacional Database: MEDLINE Language: En Journal: J Synchrotron Radiat Journal subject: RADIOLOGIA Year: 1998 Document type: Article Affiliation country: Japan Country of publication: United States