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Effects of specimen tilt in ADF-STEM imaging of a-Si/c-Si interfaces.
Yu, Z; Muller, D A; Silcox, J.
Affiliation
  • Yu Z; Physics Department, Cornell University, Ithaca, NY 14853, USA.
Ultramicroscopy ; 108(5): 494-501, 2008 Apr.
Article in En | MEDLINE | ID: mdl-17920197
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Collection: 01-internacional Database: MEDLINE Language: En Journal: Ultramicroscopy Year: 2008 Document type: Article Affiliation country: United States Country of publication: Netherlands
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Collection: 01-internacional Database: MEDLINE Language: En Journal: Ultramicroscopy Year: 2008 Document type: Article Affiliation country: United States Country of publication: Netherlands