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Effects of amorphous layers on ADF-STEM imaging.
Mkhoyan, K A; Maccagnano-Zacher, S E; Kirkland, E J; Silcox, J.
Affiliation
  • Mkhoyan KA; School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA. kam55@cornell.edu
Ultramicroscopy ; 108(8): 791-803, 2008 Jul.
Article in En | MEDLINE | ID: mdl-18374489
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Ultramicroscopy Year: 2008 Document type: Article Affiliation country: United States Country of publication: Netherlands
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Ultramicroscopy Year: 2008 Document type: Article Affiliation country: United States Country of publication: Netherlands