Synchrotron infrared reflectance microspectroscopy study of film formation and breakdown on copper. | J Synchrotron Radiat;17(1): 81-5, 2010 Jan. | MEDLINE

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Synchrotron infrared reflectance microspectroscopy study of film formation and breakdown on copper.

Hahn, F; Melendres, C A.

Affiliation

Hahn F; UMR-CNRS 6503, University of Poitiers, 40 Avenue du Recteur Pineau, 86022 Poitiers Cedex, France.

J Synchrotron Radiat ; 17(1): 81-5, 2010 Jan.

Article in En | MEDLINE | ID: mdl-20029115

Subject(s)

Copper/chemistry; Membranes, Artificial; Spectrophotometry, Infrared/methods; Synchrotrons; Materials Testing/methods; Oxidation-Reduction

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Full text: 1 Collection: 01-internacional Database: MEDLINE Main subject: Spectrophotometry, Infrared / Synchrotrons / Copper / Membranes, Artificial Language: En Journal: J Synchrotron Radiat Journal subject: RADIOLOGIA Year: 2010 Document type: Article Affiliation country: France

Search on Google

Full text: 1 Collection: 01-internacional Database: MEDLINE Main subject: Spectrophotometry, Infrared / Synchrotrons / Copper / Membranes, Artificial Language: En Journal: J Synchrotron Radiat Journal subject: RADIOLOGIA Year: 2010 Document type: Article Affiliation country: France