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Temperature dependence of gain and excess noise in InAs electron avalanche photodiodes.
Ker, Pin Jern; David, John P R; Tan, Chee Hing.
Affiliation
  • Ker PJ; Department of Electronic and Electrical Engineering, The University of Sheffield, Sir Frederick Mappin Building, Mappin Street, Sheffield. S1 3JD, UK.
Opt Express ; 20(28): 29568, 2012 Dec 31.
Article in En | MEDLINE | ID: mdl-23388783
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Opt Express Journal subject: OFTALMOLOGIA Year: 2012 Document type: Article Affiliation country: United kingdom
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Opt Express Journal subject: OFTALMOLOGIA Year: 2012 Document type: Article Affiliation country: United kingdom