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Minimum detection limit and spatial resolution of thin-sample field-emission electron probe microanalysis.
Kubo, Yugo; Hamada, Kotaro; Urano, Akira.
Affiliation
  • Kubo Y; Analysis Technology Research Center, Sumitomo Electric Industries, Ltd., 1 Taya-cho, Sakae-ku, Yokohama 244-8588, Japan. Electronic address: kubo-yugo@sei.co.jp.
Ultramicroscopy ; 135: 64-70, 2013 Dec.
Article in En | MEDLINE | ID: mdl-23876296
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Full text: 1 Collection: 01-internacional Database: MEDLINE Type of study: Diagnostic_studies Language: En Journal: Ultramicroscopy Year: 2013 Document type: Article Country of publication: Netherlands
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Full text: 1 Collection: 01-internacional Database: MEDLINE Type of study: Diagnostic_studies Language: En Journal: Ultramicroscopy Year: 2013 Document type: Article Country of publication: Netherlands