Depth profiling of metal overlayers on organic substrates with cluster SIMS.
Anal Chem
; 85(21): 10565-72, 2013 Nov 05.
Article
in En
| MEDLINE
| ID: mdl-24070427
Full text:
1
Collection:
01-internacional
Database:
MEDLINE
Type of study:
Prognostic_studies
Language:
En
Journal:
Anal Chem
Year:
2013
Document type:
Article
Affiliation country:
United States