Robust analysis of synthetic label-free DNA junctions in solution by X-ray scattering and molecular simulation. | Sci Rep;3: 3226, 2013 Nov 15. | MEDLINE

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Robust analysis of synthetic label-free DNA junctions in solution by X-ray scattering and molecular simulation.

Im, Kyuhyun; Jeong, Daun; Hur, Jaehyun; Kim, Sung-Jin; Hwang, Sungwoo; Jin, Kyeong Sik; Park, Nokyoung; Kim, Kinam.

Affiliation

Im K; 1] Frontier Research Laboratory, Samsung Advanced Institute of Technology, Samsung Electronics, Yongin, Gyeonggi-do 446-712, South Korea [2].

Sci Rep ; 3: 3226, 2013 Nov 15.

Article in En | MEDLINE | ID: mdl-24233055

Subject(s)

DNA/chemistry; Solutions/chemistry; Computer Simulation; Nucleic Acid Conformation; Synchrotrons; X-Rays

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Full text: 1 Collection: 01-internacional Database: MEDLINE Main subject: Solutions / DNA Language: En Journal: Sci Rep Year: 2013 Document type: Article Country of publication: United kingdom

Search on Google

Full text: 1 Collection: 01-internacional Database: MEDLINE Main subject: Solutions / DNA Language: En Journal: Sci Rep Year: 2013 Document type: Article Country of publication: United kingdom