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Correcting nonlinear drift distortion of scanning probe and scanning transmission electron microscopies from image pairs with orthogonal scan directions.
Ophus, Colin; Ciston, Jim; Nelson, Chris T.
Affiliation
  • Ophus C; National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, United States.
  • Ciston J; National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, United States.
  • Nelson CT; Materials Science and Engineering, University of California Berkeley, Berkeley, CA, United States.
Ultramicroscopy ; 162: 1-9, 2016 Mar.
Article in En | MEDLINE | ID: mdl-26716724

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Ultramicroscopy Year: 2016 Document type: Article Affiliation country: United States Country of publication: Netherlands

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Ultramicroscopy Year: 2016 Document type: Article Affiliation country: United States Country of publication: Netherlands