Microwave Frequency Comb from a Semiconductor in a Scanning Tunneling Microscope.

Hagmann, Mark J; Yarotski, Dmitry A; Mousa, Marwan S

Hagmann, Mark J; Yarotski, Dmitry A; Mousa, Marwan S.

Affiliation

Hagmann MJ; 1Department of Electrical and Computer Engineering,University of Utah,Salt Lake City,UT 84112,USA.
Yarotski DA; 3Los Alamos National Laboratory,Center for Integrated Nanotechnologies,Materials Physics and Applications Division,Los Alamos,NM 87545,USA.
Mousa MS; 4Department of Physics,Mu'tah University,Al-Karak 61710,Jordan.

Microsc Microanal ; 23(2): 443-448, 2017 04.

Article in En | MEDLINE | ID: mdl-27995829

Key words

laser-assisted tunneling; microwave frequency comb; scanning probe microscopy; scanning tunneling microscopy; spreading resistance

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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Microsc Microanal Year: 2017 Document type: Article Affiliation country: United States Country of publication: United kingdom

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