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Impact of Various Thermistors on the Properties of Resistive Microbolometers Fabricated by CMOS Process.
Guo, Yaozu; Ma, Haolan; Lan, Jiang; Liao, Yiming; Ji, Xiaoli.
Affiliation
  • Guo Y; College of Electronic Science and Engineering, Nanjing University, Nanjing 210023, China.
  • Ma H; College of Electronic Science and Engineering, Nanjing University, Nanjing 210023, China.
  • Lan J; College of Electronic Science and Engineering, Nanjing University, Nanjing 210023, China.
  • Liao Y; College of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing 210094, China.
  • Ji X; College of Electronic Science and Engineering, Nanjing University, Nanjing 210023, China.
Micromachines (Basel) ; 13(11)2022 Oct 30.
Article in En | MEDLINE | ID: mdl-36363891
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Micromachines (Basel) Year: 2022 Document type: Article Affiliation country: China
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Micromachines (Basel) Year: 2022 Document type: Article Affiliation country: China