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The resolutions of drive-level capacitance profiling technique.
Zhang, Xin; Ma, Yang; Zhang, Zihang; Zhang, Xiaobo; Yan, Hui; Chen, Xiaoqing; Zheng, Zilong; Zhang, Yongzhe.
Affiliation
  • Zhang X; Faculty of Materials and Manufacturing, Beijing University of Technology, Beijing 100124, China.
  • Ma Y; Key Laboratory of Optoelectronics Technology of Education Ministry of China, Faculty of Information Technology, Beijing University of Technology, Beijing 100124, China.
  • Zhang Z; Key Laboratory of Optoelectronics Technology of Education Ministry of China, Faculty of Information Technology, Beijing University of Technology, Beijing 100124, China.
  • Zhang X; Faculty of Materials and Manufacturing, Beijing University of Technology, Beijing 100124, China.
  • Yan H; Faculty of Materials and Manufacturing, Beijing University of Technology, Beijing 100124, China.
  • Chen X; Key Laboratory of Optoelectronics Technology of Education Ministry of China, Faculty of Information Technology, Beijing University of Technology, Beijing 100124, China.
  • Zheng Z; Faculty of Materials and Manufacturing, Beijing University of Technology, Beijing 100124, China.
  • Zhang Y; Key Laboratory of Optoelectronics Technology of Education Ministry of China, Faculty of Information Technology, Beijing University of Technology, Beijing 100124, China.
Rev Sci Instrum ; 94(6)2023 Jun 01.
Article in En | MEDLINE | ID: mdl-37862542
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Rev Sci Instrum Year: 2023 Document type: Article Affiliation country: China Country of publication: United States
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Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Rev Sci Instrum Year: 2023 Document type: Article Affiliation country: China Country of publication: United States