Improving the temporal resolution of event-based electron detectors using neural network cluster analysis.
Ultramicroscopy
; 256: 113881, 2024 Feb.
Article
in En
| MEDLINE
| ID: mdl-37976972
ABSTRACT
Novel event-based electron detector platforms provide an avenue to extend the temporal resolution of electron microscopy into the ultrafast domain. Here, we characterize the timing accuracy of a detector based on a TimePix3 architecture using femtosecond electron pulse trains as a reference. With a large dataset of event clusters triggered by individual incident electrons, a neural network is trained to predict the electron arrival time. Corrected timings of event clusters show a temporal resolution of 2 ns, a 1.6-fold improvement over cluster-averaged timings. This method is applicable to other fast electron detectors down to sub-nanosecond temporal resolutions, offering a promising solution to enhance the precision of electron timing for various electron microscopy applications.
Full text:
1
Collection:
01-internacional
Database:
MEDLINE
Language:
En
Journal:
Ultramicroscopy
Year:
2024
Document type:
Article
Affiliation country:
Germany
Country of publication:
Netherlands