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Effect of a High Density of Stacking Faults on the Young's Modulus of GaAs Nanowires.
Chen, Yujie; Burgess, Tim; An, Xianghai; Mai, Yiu-Wing; Tan, H Hoe; Zou, Jin; Ringer, Simon P; Jagadish, Chennupati; Liao, Xiaozhou.
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  • Burgess T; Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University , Canberra, Australian Capital Territory 2601, Australia.
  • Tan HH; Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University , Canberra, Australian Capital Territory 2601, Australia.
  • Zou J; Materials Engineering and Centre for Microscopy and Microanalysis, The University of Queensland , St. Lucia, Queensland 4072, Australia.
  • Jagadish C; Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University , Canberra, Australian Capital Territory 2601, Australia.
Nano Lett ; 16(3): 1911-6, 2016 Mar 09.
Article en En | MEDLINE | ID: mdl-26885570
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Nano Lett Año: 2016 Tipo del documento: Article Pais de publicación: Estados Unidos
Texto completo
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Nano Lett Año: 2016 Tipo del documento: Article Pais de publicación: Estados Unidos