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Laser Ablation/Ionisation Mass Spectrometry: Sensitive and Quantitative Chemical Depth Profiling of Solid Materials.
Riedo, Andreas; Grimaudo, Valentine; Moreno-García, Pavel; Neuland, Maike B; Tulej, Marek; Broekmann, Peter; Wurz, Peter.
Afiliación
  • Riedo A; Physics Institute, Space Research and Planetary Sciences University of Bern, Sidlerstrasse 5, CH-3012 Bern, Switzerland. andreas.riedo@space.unibe.ch.
  • Grimaudo V; Department of Chemistry and Biochemistry Interfacial Electrochemistry Group University of Bern Freiestrasse 3, CH-3012 Bern, Switzerland.
  • Moreno-García P; Department of Chemistry and Biochemistry Interfacial Electrochemistry Group University of Bern Freiestrasse 3, CH-3012 Bern, Switzerland.
  • Neuland MB; Physics Institute, Space Research and Planetary Sciences University of Bern, Sidlerstrasse 5, CH-3012 Bern, Switzerland.
  • Tulej M; Physics Institute, Space Research and Planetary Sciences University of Bern, Sidlerstrasse 5, CH-3012 Bern, Switzerland.
  • Broekmann P; Department of Chemistry and Biochemistry Interfacial Electrochemistry Group University of Bern Freiestrasse 3, CH-3012 Bern, Switzerland.
  • Wurz P; Physics Institute, Space Research and Planetary Sciences University of Bern, Sidlerstrasse 5, CH-3012 Bern, Switzerland.
Chimia (Aarau) ; 70(4): 268-73, 2016.
Article en En | MEDLINE | ID: mdl-27131112

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Diagnostic_studies Idioma: En Revista: Chimia (Aarau) Año: 2016 Tipo del documento: Article País de afiliación: Suiza Pais de publicación: Suiza

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Diagnostic_studies Idioma: En Revista: Chimia (Aarau) Año: 2016 Tipo del documento: Article País de afiliación: Suiza Pais de publicación: Suiza