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The EIGER detector for low-energy electron microscopy and photoemission electron microscopy.
Tinti, G; Marchetto, H; Vaz, C A F; Kleibert, A; Andrä, M; Barten, R; Bergamaschi, A; Brückner, M; Cartier, S; Dinapoli, R; Franz, T; Fröjdh, E; Greiffenberg, D; Lopez-Cuenca, C; Mezza, D; Mozzanica, A; Nolting, F; Ramilli, M; Redford, S; Ruat, M; Ruder, Ch; Schädler, L; Schmidt, Th; Schmitt, B; Schütz, F; Shi, X; Thattil, D; Vetter, S; Zhang, J.
Afiliación
  • Tinti G; Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
  • Marchetto H; ELMITEC Elektronenmikroskopie GmbH, D-38678 Clausthal-Zellerfeld, Germany.
  • Vaz CAF; Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
  • Kleibert A; Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
  • Andrä M; Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
  • Barten R; Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
  • Bergamaschi A; Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
  • Brückner M; Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
  • Cartier S; Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
  • Dinapoli R; Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
  • Franz T; ELMITEC Elektronenmikroskopie GmbH, D-38678 Clausthal-Zellerfeld, Germany.
  • Fröjdh E; Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
  • Greiffenberg D; Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
  • Lopez-Cuenca C; Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
  • Mezza D; Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
  • Mozzanica A; Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
  • Nolting F; Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
  • Ramilli M; Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
  • Redford S; Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
  • Ruat M; Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
  • Ruder C; Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
  • Schädler L; Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
  • Schmidt T; Fritz-Haber-Institute of the Max-Planck-Society, Department of Chemical Physics, D-14195 Berlin, Germany.
  • Schmitt B; Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
  • Schütz F; ELMITEC Elektronenmikroskopie GmbH, D-38678 Clausthal-Zellerfeld, Germany.
  • Shi X; Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
  • Thattil D; Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
  • Vetter S; Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
  • Zhang J; Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
J Synchrotron Radiat ; 24(Pt 5): 963-974, 2017 Sep 01.
Article en En | MEDLINE | ID: mdl-28862618
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: J Synchrotron Radiat Asunto de la revista: RADIOLOGIA Año: 2017 Tipo del documento: Article País de afiliación: Suiza Pais de publicación: Estados Unidos
Texto completo
Añadir a Mi BVS
Imprimir
XML
PubMed Links
Buscar en Google

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: J Synchrotron Radiat Asunto de la revista: RADIOLOGIA Año: 2017 Tipo del documento: Article País de afiliación: Suiza Pais de publicación: Estados Unidos