Global optimization for accurate determination of EBSD pattern centers.

Pang, Edward L; Larsen, Peter M; Schuh, Christopher A

Pang, Edward L; Larsen, Peter M; Schuh, Christopher A.

Afiliación

Pang EL; Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Ave, Cambridge, MA 02139, USA.
Larsen PM; Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Ave, Cambridge, MA 02139, USA.
Schuh CA; Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Ave, Cambridge, MA 02139, USA. Electronic address: schuh@mit.edu.

Ultramicroscopy ; 209: 112876, 2020 02.

Article en En | MEDLINE | ID: mdl-31707232

Palabras clave

Calibration; Dynamical simulation; EBSD; Global optimization; Pattern center

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Ultramicroscopy Año: 2020 Tipo del documento: Article País de afiliación: Estados Unidos Pais de publicación: Países Bajos

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