Prospect for measuring two-dimensional van der Waals magnets by electron magnetic chiral dichroism.

Song, Dongsheng; Zheng, Fengshan; Dunin-Borkowski, Rafal E

Song, Dongsheng; Zheng, Fengshan; Dunin-Borkowski, Rafal E.

Afiliación

Song D; Information Materials and Intelligent Sensing Laboratory of Anhui Province, Key Laboratory of Structure and Functional Regulation of Hybrid Materials of Ministry of Education, Institutes of Physical Science and Information Technology, Anhui University, Hefei 230601, China; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich 52425, Germany. Electronic address: dsong@ahu.edu.cn.
Zheng F; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich 52425, Germany.
Dunin-Borkowski RE; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich 52425, Germany.

Ultramicroscopy ; 234: 113476, 2022 Apr.

Article en En | MEDLINE | ID: mdl-35114564

Palabras clave

Electron magnetic chiral dichroism; Signal-to-noise-ratio; Transmission electron microscopy; Two-dimensional van der Waals magnets

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Ultramicroscopy Año: 2022 Tipo del documento: Article Pais de publicación: Países Bajos

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