Deterministic Conductive Filament Formation and Evolution for Improved Switching Uniformity in Embedded Metal-Oxide-Based MemristorsâA Phase-Field Study.

Zhang, Kena; Ganesh, Panchapakesan; Cao, Ye

Deterministic Conductive Filament Formation and Evolution for Improved Switching Uniformity in Embedded Metal-Oxide-Based MemristorsâA Phase-Field Study.

Zhang, Kena; Ganesh, Panchapakesan; Cao, Ye.

Afiliación

Zhang K; Department of Materials Science and Engineering, University of Texas at Arlington, Arlington, Texas 76019, United States.
Ganesh P; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States.
Cao Y; Department of Materials Science and Engineering, University of Texas at Arlington, Arlington, Texas 76019, United States.

ACS Appl Mater Interfaces ; 15(17): 21219-21227, 2023 May 03.

Article en En | MEDLINE | ID: mdl-37083295

Palabras clave

conductive filament; embedded structure; phase-field simulation; resistive switching; uniformity

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: ACS Appl Mater Interfaces Asunto de la revista: BIOTECNOLOGIA / ENGENHARIA BIOMEDICA Año: 2023 Tipo del documento: Article País de afiliación: Estados Unidos Pais de publicación: Estados Unidos

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