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Commissioning of a frequency-resolved optical gating system at the OMEGA EP laser facility: SpecFROG.
Kemp, G E; Link, A; Ping, Y; Ayers, S; Patel, P K.
Afiliação
  • Kemp GE; Lawrence Livermore National Laboratory, Livermore, California 94550-9698, USA.
  • Link A; Lawrence Livermore National Laboratory, Livermore, California 94550-9698, USA.
  • Ping Y; Lawrence Livermore National Laboratory, Livermore, California 94550-9698, USA.
  • Ayers S; Lawrence Livermore National Laboratory, Livermore, California 94550-9698, USA.
  • Patel PK; Lawrence Livermore National Laboratory, Livermore, California 94550-9698, USA.
Rev Sci Instrum ; 86(9): 093501, 2015 Sep.
Article em En | MEDLINE | ID: mdl-26429437
We present the design and commissioning of a new single-shot, frequency-resolved optical gating system on the OMEGA EP laser facility - dubbed "SpecFROG" - for characterizing the instantaneous intensity and phase of ∼10 ps pulses used to study ultra-intense laser-plasma interactions. A polarization-gating geometry is employed to ensure tha the diagnostic is broadband and has unambiguous time directionality. SpecFROG is capable of characterizing ∼10 s of mJ pulses with durations between 0.5-25 ps with ≲285 fs geometrical temporal blurring and ∼0.1% spectral shift resolutions over an adjustable total spectral shifting window of ∼15% of the carrier wavelength λo; configurations currently exist for both the fundamental (1ω, λo = 1.054 µm) and second harmonic (2ω, λo = 0.527 µm) of the EP pulse. Initial specular reflectivity measurements of the ∼1 kJ, ∼10 ps OMEGA EP laser off solid density aluminum targets suggest drastically different scalings for specular pulse properties compared to picosecond-scale pulses of comparable intensities.

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Rev Sci Instrum Ano de publicação: 2015 Tipo de documento: Article País de afiliação: Estados Unidos País de publicação: Estados Unidos

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Rev Sci Instrum Ano de publicação: 2015 Tipo de documento: Article País de afiliação: Estados Unidos País de publicação: Estados Unidos