Atomic-Scale Mechanisms of Defect-Induced Retention Failure in Ferroelectrics.

Li, Linze; Zhang, Yi; Xie, Lin; Jokisaari, Jacob R; Beekman, Christianne; Yang, Jan-Chi; Chu, Ying-Hao; Christen, Hans M; Pan, Xiaoqing

Li, Linze; Zhang, Yi; Xie, Lin; Jokisaari, Jacob R; Beekman, Christianne; Yang, Jan-Chi; Chu, Ying-Hao; Christen, Hans M; Pan, Xiaoqing.

Afiliação

Li L; Department of Chemical Engineering and Materials Science, University of California - Irvine , Irvine, California 92697, United States.
Zhang Y; Department of Chemical Engineering and Materials Science, University of California - Irvine , Irvine, California 92697, United States.
Xie L; Department of Chemical Engineering and Materials Science, University of California - Irvine , Irvine, California 92697, United States.
Jokisaari JR; National Laboratory of Solid State Microstructures and College of Engineering and Applied Sciences, Nanjing University , Nanjing, Jiangsu 210093, China.
Beekman C; Department of Materials Science and Engineering, University of Michigan , Ann Arbor, Michigan 48109, United States.
Yang JC; Materials Science and Technology Division, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States.
Chu YH; Department of Physics, National Cheng Kung University , Tainan 701, Taiwan.
Christen HM; Department of Materials Science and Engineering, National Chiao Tung University , Hsinchu 300, Taiwan.
Pan X; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37831, United States.

Nano Lett ; 17(6): 3556-3562, 2017 06 14.

Article em En | MEDLINE | ID: mdl-28471679

Palavras-chave

Ferroelectric; defect; head-to-head polarization; mixed-phase structure; retention failure

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nano Lett Ano de publicação: 2017 Tipo de documento: Article País de afiliação: Estados Unidos País de publicação: Estados Unidos

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