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1.
Appl Opt ; 62(24): 6534-6541, 2023 Aug 20.
Article in English | MEDLINE | ID: mdl-37706848

ABSTRACT

In this work, we study multimodal interference filters with a graphite oxide coating. Use of the multimodal interference filter shows a distinctive peak in the signal spectrum, and when using the exfoliated graphite coated multimodal interference filter, the signal shows different spectral changes, such as the full width at half maximum of the curve, the maximum power, and central wavelength, which indicates that graphite oxide absorbs part of the energy. In addition, microscope observations when a He-Ne laser is passed through the filter confirm that graphite oxide is adhered to the filter.

2.
Nanotechnology ; 23(49): 495705, 2012 Dec 14.
Article in English | MEDLINE | ID: mdl-23149480

ABSTRACT

A new resonance-tracking (RT) method using fast frequency sweeping excitation was developed for quantitative scanning probe microscopy (SPM) imaging. This method allows quantitative imaging of elastic properties and ferroelectrical domains with nanoscale resolution at high data acquisition rates. It consists of a commercial AFM system combined with a high-frequency lock-in amplifier, a programmed function generator and a fast data acquisition card. The resonance-tracking method was applied to the atomic force acoustic microscopy (AFAM) and to the piezoresponse force microscopy (PFM) modes. Plots of amplitude versus time and phase versus time for resonant spectra working with different sweeping frequencies were obtained to evaluate the response speed of the lock-in amplifier. It was proved that this resonance-tracking method allows suitable spectral acquisition at a rate of about 5 ms/pixel, which is useful for SPM imaging in a practical scanning time. In order to demonstrate the system performance, images of RT-AFAM for TiN films and RT-PFM for GeTe are shown.


Subject(s)
Image Enhancement/instrumentation , Micro-Electrical-Mechanical Systems/instrumentation , Microscopy, Acoustic/instrumentation , Microscopy, Atomic Force/instrumentation , Microscopy, Scanning Probe/instrumentation , Equipment Design , Equipment Failure Analysis
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