RESUMO
In this article we consider a difficult combinatorial optimization problem arising from the operation of a system for testing electronic circuit boards (ECB). This problem was proposed to us by a company that makes a system for testing ECBs and is looking for an efficient way of planning the tests on any given ECB. Because of its difficulty, we first split the problem into a covering subproblem and a sequencing subproblem. We also give a global formulation of the test planning problem. Then we present and discuss results pertaining to the covering and sequencing subproblems. These results demonstrate that their solution yields testing plans that are much better than those currently used by the company. Finally we conclude our article by outlining avenues for future research.